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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Multilayer and Grazing Incidence X-Ray/EUV Optics II - High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces
Christensen, Finn E., Abdali, Salim, Hornstrup, Allan, Schnopper, Herbert W., Slane, Patrick O., Romaine, Suzanne E., Hoover, Richard B.Volume:
2011
Year:
1994
Language:
english
DOI:
10.1117/12.167242
File:
PDF, 759 KB
english, 1994