SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Applications of Digital Image Processing XVII - Three-dimensional x-ray inspection of food products
Graves, Mark, Batchelor, Bruce G., Palmer, Stephen C., Tescher, Andrew G.Volume:
2298
Year:
1994
Language:
english
DOI:
10.1117/12.186536
File:
PDF, 912 KB
english, 1994