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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications - Advanced computed tomography inspection system (ACTIS): an overview of the technology and its applications
Beshears, Ronald D., Hediger, Lisa H., Minnifield, Nona K.Volume:
2270
Year:
1994
Language:
english
DOI:
10.1117/12.188822
File:
PDF, 1.46 MB
english, 1994