SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Tolerance analysis of the Far Ultraviolet Spectroscopic Explorer (FUSE): a statistical approach
Wilkinson, Erik, Green, James C., Sahnow, David J., Fineschi, SilvanoVolume:
2283
Year:
1994
Language:
english
DOI:
10.1117/12.193193
File:
PDF, 279 KB
english, 1994