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SPIE Proceedings [SPIE International Conference on Micro-and Nano-Electronics 2012 - Zvenlgorod, Russian Federation (Monday 1 October 2012)] International Conference Micro- and Nano-Electronics 2012 - Characterization and qualification of deep-submicron OTP poly-fuse memory
Belova, N., Allman, Derryl, Tibbitts, Stephen, Orlikovsky, Alexander A.Volume:
8700
Year:
2013
Language:
english
DOI:
10.1117/12.2017548
File:
PDF, 522 KB
english, 2013