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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - A full reference image quality assessment method for retina-like sensor
Luo, Zhihu, Cao, Fengmei, Lin, Xinggang, Zheng, JesseVolume:
9045
Year:
2013
Language:
english
DOI:
10.1117/12.2032837
File:
PDF, 1.17 MB
english, 2013