SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 1 February 2014)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI - Two-frequency confocal laser scanning fluorescence microscope for specimen-induced spherical aberration reduction
Brown, Thomas G., Cogswell, Carol J., Wilson, Tony, Chung, Yung-Chin, Wu, Jheng-Syong, Chou, ChienVolume:
8949
Year:
2014
Language:
english
DOI:
10.1117/12.2038874
File:
PDF, 305 KB
english, 2014