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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Remote control in-plane displacement measurement system
Kozlowska, Anna, Kujawinska, Malgorzata, Gorecki, Christophe, Gorecki, ChristopheVolume:
2782
Year:
1996
DOI:
10.1117/12.250750
File:
PDF, 878 KB
1996