SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Materials, Devices, and Systems for Optoelectronic Processing - Optical aided target recognition system
Kirsch, James C., Jones, Brian K., Booth, Joseph J., Duffey, Jason N., Loudin, Jeffrey A., Sloan, Jeffrey A., Neff, John A., Javidi, BahramVolume:
2848
Year:
1996
Language:
english
DOI:
10.1117/12.256151
File:
PDF, 1.66 MB
english, 1996