SPIE Proceedings [SPIE Photonics East '96 - Boston, MA...

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SPIE Proceedings [SPIE Photonics East '96 - Boston, MA (Monday 18 November 1996)] Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II - Surface classification using artificial neural networks

Mainsah, E., Ndumu, Divine T., Ndumu, Abongwa N., Harding, Kevin G., Svetkoff, Donald J.
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Volume:
2909
Year:
1997
Language:
english
DOI:
10.1117/12.263318
File:
PDF, 569 KB
english, 1997
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