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SPIE Proceedings [SPIE Non-Destructive Evaluation Techniques for Aging Infrastructure & Manufacturing - San Antonio, TX (Tuesday 31 March 1998)] Process Control and Sensors for Manufacturing - Amorphous silicon imaging system for improved x-ray image capture in nondestructive evaluation
Anderson, Einar E., Hartney, Mark A., Weisfield, Richard L., Bossi, Richard H., Pepper, David M.Volume:
3399
Year:
1998
Language:
english
DOI:
10.1117/12.302551
File:
PDF, 917 KB
english, 1998