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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Optical Pattern Recognition IX - In-class distortion tolerance, out-of-class discrimination, and clutter resistance of correlation filters that employ a space domain nonlinearity applied to wavelet-filtered input images
Jamal-Aldin, Lamia S., Young, Rupert C. D., Chatwin, Christopher R., Casasent, David P., Chao, Tien-HsinVolume:
3386
Year:
1998
Language:
english
DOI:
10.1117/12.304755
File:
PDF, 1.56 MB
english, 1998