SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Infrared Technology and Applications XXIV - Characterization of In-doped CdTe grown by molecular beam epitaxy
Kang, Tae W., Leem, J. H., Hou, Y. B., Ryu, Y. S., Lee, Ho-Young, Jeon, H. C., Hyun, J. K., Kang, C. K., Kim, T. W., Andresen, Bjorn F., Strojnik, MarijaVolume:
3436
Year:
1998
Language:
english
DOI:
10.1117/12.327988
File:
PDF, 188 KB
english, 1998