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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX - VLSI readout for imaging with polycrystalline mercuric iodide detectors
Turchetta, Renato A. D., Dulinski, Wojtek, Husson, D., Klein, N., Riester, J. L., Schieber, Michael M., Zuck, Asaf, Braiman, M., Melekhov, Leonid, Nissenbaum, J., Sanguinetti, S., Siegmund, Oswald H.Volume:
3445
Year:
1998
Language:
english
DOI:
10.1117/12.330293
File:
PDF, 548 KB
english, 1998