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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - 3D inspection system for manufactured machine parts
Garcia, David, Sebastian y Zuniga, Jose M., Sanchez Moreno, Francisco M., Jimenez, Luis M., Gonzalez, J. M., Tobin, Jr., Kenneth W., Chang, Ning S.Volume:
3652
Year:
1999
Language:
english
DOI:
10.1117/12.341145
File:
PDF, 2.45 MB
english, 1999