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SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1999 - Boulder, CO (Monday 4 October 1999)] Laser-Induced Damage in Optical Materials: 1999 - Thickness dependence of damage thresholds for 193-nm dielectric mirrors by predamage sensitive photothermal technique
Blaschke, Holger, Arens, Winfried, Ristau, Detlev, Martin, Sven, Li, Bincheng, Welsch, Eberhard, Exarhos, Gregory J., Guenther, Arthur H., Kozlowski, Mark R., Lewis, Keith L., Soileau, M. J.Volume:
3902
Year:
2000
Language:
english
DOI:
10.1117/12.379306
File:
PDF, 401 KB
english, 2000