SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Three-Dimensional Image Capture and Applications III - Entropy of profile sections to estimate the next sensor position
Liska, Christian, Sablatnig, Robert, Corner, Brian D., Nurre, Joseph H.Volume:
3958
Year:
2000
Language:
english
DOI:
10.1117/12.380055
File:
PDF, 941 KB
english, 2000