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SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Munich, Germany (Monday 27 March 2000)] Optical and IR Telescope Instrumentation and Detectors - Evaluation of cryogenic readout circuits with GaAs JFETs for far-infrared detectors
Okumura, Kenichi, Hosako, Iwao, Akiba, Makoto, Hiromoto, Norihisa, Iye, Masanori, Moorwood, Alan F. M.Volume:
4008
Year:
2000
Language:
english
DOI:
10.1117/12.395505
File:
PDF, 1.34 MB
english, 2000