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SPIE Proceedings [SPIE Environmental and Industrial Sensing - Boston, MA (Sunday 5 November 2000)] Industrial Sensing Systems - Prospects for pratical and economic FOS solutions for automotive measurement applications

McGeehin, Peter, Wang, Anbo, Udd, Eric
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Volume:
4202
Year:
2000
Language:
english
DOI:
10.1117/12.411731
File:
PDF, 833 KB
english, 2000
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