SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Machine Vision Applications in Industrial Inspection IX - Hough transform for line and plane detection based on the conjugate formulation
Lee, Ho-Jin, Ahn, Hyoung-Joo, Song, Jung-Hee, Park, Rae-Hong, Hunt, Martin A.Volume:
4301
Year:
2001
Language:
english
DOI:
10.1117/12.420918
File:
PDF, 177 KB
english, 2001