SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Light-Emitting Diodes: Research, Manufacturing, and Applications VII - Extremely high breakdown voltage in high-brightness InGaN LEDs
Wang, K. R., Huang, S. C., Yeh, M. F., Chung, Y. T., Chang, Y. W., Sun, C. J., Chung, C. T., Tran, Chuong A., Schubert, E. Fred, Yao, H. Walter, Linden, Kurt J., McGraw, Daniel J.Volume:
4996
Year:
2003
Language:
english
DOI:
10.1117/12.485631
File:
PDF, 68 KB
english, 2003