SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Signal Processing Algorithms, Architectures, and Implementations XIII - Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry
Shin, YongJune, Luk, Franklin T., Powers, Edward J., Choe, TokSon, Sung, Seunghoon, Yook, JongGwan, Park, JinBaeVolume:
5205
Year:
2003
Language:
english
DOI:
10.1117/12.505379
File:
PDF, 524 KB
english, 2003