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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Constants of Materials for UV to X-Ray Wavelengths - Improved techniques for measuring x-ray mass attenuation coefficients
de Jonge, Martin D., Soufli, Regina, Seely, John F., Tran, Chanh Q., Chantler, Christopher T., Barnea, ZwiVolume:
5538
Year:
2004
Language:
english
DOI:
10.1117/12.549711
File:
PDF, 312 KB
english, 2004