SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - Phase contrast stereometry: fatigue crack mapping in 3D
Ignatiev, Konstantin I., Bonse, Ulrich, Lee, Wah-Keat, Fezzaa, Kamel, De Carlo, Francesco, Stock, Stuart R.Volume:
5535
Year:
2004
Language:
english
DOI:
10.1117/12.560201
File:
PDF, 553 KB
english, 2004