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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Optical parameters analysis of a semi-conductive film based on genetic algorithm
Ning, Yu, Hou, Xun, Yuan, Jiahu, Ji, Jiarong, Jiang, Zongfu, Wyant, James C., Wang, Hexin, Ye, Weimin, Zhao, Chen, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.677959
File:
PDF, 300 KB
english, 2005