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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - A complete digital optics applied to digital holographic microscopy: application to chromatic aberration compensation
Colomb, Tristan, Osten, Wolfgang, Gorecki, Christophe, Charrière, Florian, Kühn, Jonas, Novak, Erik L., Montfort, Frédéric, Depeursinge, ChristianVolume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.726052
File:
PDF, 1.06 MB
english, 2007