SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Advanced Materials and Devices for Sensing and Imaging III - Signal processing method of the diameter measurement system based on CCD parallel light projection method
Song, Qing, Wang, Anbo, Zhang, Yimo, Zhu, Sijia, Yan, Han, Ishii, Yukihiro, Wu, WenqianVolume:
6829
Year:
2007
Language:
english
DOI:
10.1117/12.757708
File:
PDF, 338 KB
english, 2007