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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Unconventional Imaging IV - Phase error correction for multiple planes using sharpness metrics
Tippie, Abbie E., Dolne, Jean J., Karr, Thomas J., Fienup, James R., Gamiz, Victor L.Volume:
7094
Year:
2008
Language:
english
DOI:
10.1117/12.795193
File:
PDF, 284 KB
english, 2008