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SPIE Proceedings [SPIE Advanced Laser Technologies 2007 - Levi, Finland (Monday 3 September 2007)] Advanced Laser Technologies 2007 - Dynamic-speckle profilometer for online measurements of coating thickness
Kamshilin, Alexei A., Shcherbakov, Ivan A., Myllylä, Risto, Semenov, Dmitry, Nippolainen, Ervin, Priezzhev, Alexander V., Kinnunen, Matti, Miridonov, Serguei, Pustovoy, Vladimir I., Kirillin, MikhailVolume:
7022
Year:
2007
Language:
english
DOI:
10.1117/12.803943
File:
PDF, 432 KB
english, 2007