SPIE Proceedings [SPIE International Symposium on Instrumentation Science and Technology - Shenyang, China (Monday 15 September 2008)] Fifth International Symposium on Instrumentation Science and Technology - Universal opto-electronic measuring modules in distributed measuring systems
Yaryshev, Sergey, Tan, Jiubin, Wen, Xianfang, Konyakhin, Igor, Timofeev, AlexanderVolume:
7133
Year:
2008
Language:
english
DOI:
10.1117/12.821251
File:
PDF, 119 KB
english, 2008