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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Two-wavelength moire deflection tomography in studying the dispersive characteristic for flame flow fields
Chen, Yun-yun, Yoshizawa, Toru, Wei, Ping, Song, Yang, He, An-zhi, Zheng, Jesse, Li, Zhen-huaVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837439
File:
PDF, 942 KB
english, 2009