SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Texture recognition of SAR image based on surfacelet transform
Liu, Dandan, Jiang, Ya-Dong, Kippelen, Bernard, Zhao, Can, Tang, Chunrui, Yu, JunshengVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.866701
File:
PDF, 334 KB
english, 2010