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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Infrared, Millimeter Wave, and Terahertz Technologies - Terahertz imaging technique and application in large scale integrated circuit failure inspection
Di, Zhi-gang, Zhang, Cunlin, Zhang, Xi-Cheng, Yao, Jian-quan, Jia, Chun-rong, Siegel, Peter H., He, Li, Xu, De-gang, Bing, Pi-bin, Shi, Sheng-Cai, Yang, Peng-fei, Zheng, Yi-boVolume:
7854
Year:
2010
Language:
english
DOI:
10.1117/12.868797
File:
PDF, 3.05 MB
english, 2010