SPIE Proceedings [SPIE 1983 International Techincal...

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SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Optical System Design, Analysis, and Production - Electronic Vertical Goniometer: A Semi-Automatic Instrument For Determining The Image Geometry Of Aerial Camera Lenses

Mathieu, Ernst, Fischer, Robert E., Rogers, Philip J.
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Volume:
399
Year:
1983
Language:
english
DOI:
10.1117/12.935459
File:
PDF, 8.00 MB
english, 1983
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