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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Rays in Materials Analysis: Novel Applications and Recent Developments - X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-Rays
Chaney, Robert, Cormia, Robert, Siordia, Ruth, Rusch, Thomas W.Volume:
690
Year:
1986
Language:
english
DOI:
10.1117/12.936604
File:
PDF, 6.51 MB
english, 1986