SPIE Proceedings [SPIE First European Conference on Optics...

  • Main
  • SPIE Proceedings [SPIE First European...

SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Two Wavelength Speckle Images Applied To Contouring

Tribillon, Gilbert, Grosmann, Michel H., Meyrueis, Patrick
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
136
Year:
1978
Language:
english
DOI:
10.1117/12.956174
File:
PDF, 4.24 MB
english, 1978
Conversion to is in progress
Conversion to is failed