Scanning quantum dot microscopy: A quantitative method to...

Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces

Green, Matthew F. B., Wagner, Christian, Leinen, Philipp, Deilmann, Thorsten, Krüger, Peter, Rohlfing, Michael, Tautz, F. Stefan, Temirov, Ruslan
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Volume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.08NA04
Date:
August, 2016
File:
PDF, 1.67 MB
english, 2016
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