Philosophical Transactions Mathematical Physical & Engineering Sciences
1999 / 10 Vol. 357; Iss. 1761
X-ray topography and diffraction studies of misfit dislocation nucleation in Si-based structures
Goorsky, M. S., Feichtinger, P., Fukuto, H., U'Ren, G.Volume:
357
Language:
english
Journal:
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
DOI:
10.1098/rsta.1999.0465
Date:
October, 1999
File:
PDF, 309 KB
english, 1999