[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - Dependability evaluation of COTS microprocessors via on-chip debugging facilities
Isaza-Gonzalez, Jose, Serrano-Cases, Alejandro, Restrepo-Calle, Felipe, Cuenca-Asensi, Sergio, Martinez-Alvarez, AntonioYear:
2016
Language:
english
DOI:
10.1109/latw.2016.7483335
File:
PDF, 2.22 MB
english, 2016