Study of electromigration-induced formation of discrete...

Study of electromigration-induced formation of discrete voids in flip-chip solder joints by in-situ 3D laminography observation and finite-element modeling

Chang, Yuan-Wei, Cheng, Yin, Xu, Feng, Helfen, Lukas, Tian, Tian, Di Michiel, Marco, Chen, Chih, Tu, King-Ning, Baumbach, Tilo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
117
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2016.06.059
Date:
September, 2016
File:
PDF, 4.84 MB
english, 2016
Conversion to is in progress
Conversion to is failed