Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition
Arosa, Yago, Lago, Elena López, Varela, Luis Miguel, de la Fuente, RaúlVolume:
24
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.24.017303
Date:
July, 2016
File:
PDF, 2.25 MB
english, 2016