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Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories
Gupta, Saket, Monzel, Carl, Reed, Daniel S., Zhang, Yifei, Winter, Mark, Buer, MyronYear:
2016
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2016.2556120
File:
PDF, 1.37 MB
english, 2016