[IEEE 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A 70nW, 0.3V temperature compensation voltage reference consisting of subthreshold MOSFETs in 65nm CMOS technology
Lu, Ting-Chou, Ker, Ming-Dou, Zan, Hsiao-WenYear:
2016
Language:
english
DOI:
10.1109/vlsi-dat.2016.7482571
File:
PDF, 168 KB
english, 2016