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Scanning schemes in white light Photoelasticity – Part I: Critical assessment of existing schemes
Ramakrishnan, Vivek, Ramesh, K.Language:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2016.06.016
Date:
June, 2016
File:
PDF, 4.13 MB
english, 2016