Modeling of diffusion mechanism of conductive channel...

Solid-State Electronics 2016 / 09 Vol. 123

Modeling of diffusion mechanism of conductive channel oxidation in a Pt/NiO/Pt memory switching structure

Sysun, V.I., Bute, I.V., Boriskov, P.P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
123
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.05.019
Date:
September, 2016
File:
PDF, 1.57 MB
english, 2016
Conversion to is in progress
Conversion to is failed