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Solid-State Electronics 2016 / 7

Characterization of charge trapping phenomena at III–N/dielectric interfaces

Stradiotto, Roberta, Pobegen, Gregor, Ostermaier, Clemens, Grasser, Tibor
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.07.017
Date:
July, 2016
File:
PDF, 1.56 MB
english, 2016
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