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Energy and Delay Tradeoffs of Soft Error Masking for 16nm FinFET Logic Paths: Survey and Impact of Process Variation in Near Threshold Region
Alghareb, Faris, Ashraf, Rizwan, Alzahrani, Ahmad, DeMara, RonaldYear:
2016
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/tcsii.2016.2587763
File:
PDF, 888 KB
english, 2016