![](/img/cover-not-exists.png)
Depth measurement using structured light and spatial frequency
Chan, Shih-Yu, Shih, Hsi-Fu, Chen, Jenq-ShyongVolume:
55
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.55.005069
Date:
July, 2016
File:
PDF, 1.60 MB
english, 2016