[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - A method for extracting TSV feature points based on optical micro-image
Niu Yanzhao,, Wang Xiaofei,Year:
2015
Language:
english
DOI:
10.1109/icemi.2015.7494526
File:
PDF, 744 KB
english, 2015