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An Empirical Comparison of Model Validation Techniques for Defect Prediction Models
Tantithamthavorn, Chakkrit, McIntosh, Shane, Hassan, Ahmed, Matsumoto, KenichiYear:
2016
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/tse.2016.2584050
File:
PDF, 1.80 MB
english, 2016